Networks Europe Nov-Dec 2016 | Page 32

32 TEST AND MEASUREMENT broadband noise covering the entire uplink band, rather than single interfering frequencies. The goal of field engineers and technicians is to reduce the PIM magnitude so it doesn’t negatively impact site performance. This is achieved by finding the PIM sources in the RF path and making them more linear. Improving system linearity reduces the magnitude of all IM products, with the objective being to drive those that fall in the Rx band below the receiver noise floor. PIM. There are recorded instances in which simply tightening the connections with a torque wrench improved the PIM performance of a distributed antenna system (DAS) by 20 dB. External PIM Sources PIM sources are not only inside the coaxial cables, PIM can be caused by loose metal-to-metal junctions in the RF path beyond the antenna. Loose or rusty mounting hardware, metal structures near the antenna, or metal objects in front of the antenna all can be sources of PIM. The image on the previous page provides insight into what PIM looks like at a cell site. This is an example where universal mobile telecommunications system (UMTS) carriers at 2100 MHz are mixing with Groupe Spécial Mobile (GSM) signals at 1900 MHz at a macro site. Whenever PIM rises above the noise floor, it impacts site performance. In this case, the PIM magnitude is 30 dB above the noise floor, resulting in reduced cell size and increased dropped call rates. PIM can have another negative impact on the customer experience – the high noise levels it causes requires greater Tx power by the mobile device, which results in shorter battery life for the consumer’s UE. At minimum, this can lower throughput for that customer – costing operators potential revenue and, at maximum, it will increase customer churn. PIM Frequencies Low-order IM products, such as IM3 and IM5, are more likely to cause interference than high-order IM products, such as IM7 and IM9. Different PIM sources behave differently but in general, IM3 is the highest magnitude product. IM5 is typically 20 dB lower than IM3, IM7 is typically 15 dB lower than IM5, and so on. Depending on the system linearity, IM products below IM5 may already be low enough that they don’t cause interference. This doesn’t mean that high-order IM products can be ignored, only that the likelihood they will cause interference is lower than the chances of IM3 and IM5 creating interference. PIM bandwidth increases as the carrier bandwidth and IM order increase (i.e. IM3 = 3x the carrier bandwidth, and IM5 = 5x the carrier bandwidth). As a result, PIM often appears as The test Process The best way to measure linearity is with a PIM analyser – a specialised test instrument used to excite non-linearities in the RF path. The instrument sends two continuous wave (CW) test signals into the system under test, and then monitors the magnitude of the noise generated by these test signals. PIM testers typically measure the 3rd order intermodulation product as a way to characterise the linearity of the system. If IM3 is low, the linearity is good. Conversely, if IM3 is high, repairs are needed. While PIM is a growing concern, it's not the only issue field technicians have to worry about. They must also conduct sweeps to ensure the performance of antenna line systems. For years, field technicians had to use two separate instruments for these equally important measurements, as they are distinctly different. A sweep tester was necessary to measure how efficiently signals passed through a system. Then, a PIM tester was needed to measure the noise generated when those signals passed through the system. A sweep tester – also known as a cable and antenna analyser – transmits a single test frequency at low power and measures how much energy bounces back at that frequency. The ratio of power received vs. power transmitted is displayed as a data point on the screen. The instrument then steps to a new frequency and repeats the process until a full start – stop frequency range has been measured. Because a cable and antenna analyser only transmits a single test frequency, it’s not capable of generating PIM. Defects that cause PIM may or may not cause high reflections. Likewise, defects that cause reflections may or may not cause PIM. The presence of one is not an indication of the other. Therefore, both tests must be performed to assure the quality of the RF infrastructure. Dual analysers There are instruments that can fully certify both PIM and sweep performance, allowing field technicians to carry fewer instruments to a site, and to hoist just one analyser to the top of the tower for remote radio head testing. Another benefit to combining PIM and antenna sweeping into a single instrument is that field technicians have the ability to overlay the active DTP measurement with a distance-to-fault (DTF) measurement. When a DTP measurement is made, the instrument automatically conducts a DTF first and displays the overlay. DTF traces act like maps to very clearly show RF connector locations. Since PIM often occurs at RF connections, field technicians can use these highresolution DTF plots to help identify bad connections. Field technicians responsible for maintaining the quality of wireless networks must efficiently locate PIM sources to quickly and effectively eliminate interference that can lower network performance. Utilising a test solution that can effectively measure PIM and conduct antenna analysis will ultimately reduce test time and lower costs. n www.networkseuropemagazine.com