attoDRY1100
touchscreen control of field & temperature
The attoDRY1100 offers a truly unique low temperature measurement
platform with a fully automated gas handling system. The integrated
touchscreen allows for conveniently setting the desired field (B) and
temperature (T) without even using a PC. More elaborate measurement
schemes such as programmable sweeps of B and T are easily possible via
a USB connection and a LabVIEW interface.
The toploading design enables quick and easy sample exchange,
while offering a generous sample space of 49.7 mm in diameter. The
unmatched cooling performance via exchange gas coupling enables
probe cooldown times as fast as 1-2 hours, and the initial cooldown time
of the complete system is around 10-15 hours including a 9 T magnet.
The temperature stability was measured to be better than ±5 mK over
14 hours at 4 K.
Last but not least, the attoDRY1100 was specifically designed to
provide an ultra-low vibration measurement platform for cryogenic
scanning probe experiments without the need for liquid helium. Due
to a proprietary design, mechanical vibrations created by the pulse-
tube coldhead are decoupled from the measurement platform. When
measured with the attoAFM I, vibration amplitudes of less than 0.15 nm
RMS are routinely achieved (bandwidth of 200 Hz, vertical direction)*.
*Further reading: F.P. Quacquarelli et al., arXiv:1404.2046v1
PRODUCT KEY FEATURES
• scanning probe microscopy experiments in
a cryogen-free, low vibration environment
• fast exchange of samples and/or scanning probe tips
• measurements at a broad range of temperature and
magnetic field (optional) with highest stability
BENEFITS
• no liquid helium required
• integrated 4.3“ touchscreen
• full automation of field and temperature control
• USB/Ethernet interface, LabVIEW control
• designed for vibration sensitive measurements
• in-situ double rotator for full field (9 T) in 3D (optional)
APPLICATION EXAMPLES
• solid state physics and quantum dot optics
• material science research on ceramics, polymers,
additives, alloys, ..
• semiconductor device characterization
COMPATIBLE MICROSCOPE SYSTEMS
• attoAFM I, attoMFM I, attoSHPM, attoAFM III, attoCFM I,
attoCFM II, attoCFM III, attoRAMAN
• attoAFM/CFM (on request)