Selected Applications
Premium Line - SPM measurements
Vectorial Scanning Force Microscopy Using a Nanowire Sensor
Using a GaAs/AlGaAs nanowire and its two distinct flexural modes the group of
Martino Poggio in Basel was able to detect lateral 2D forces in a novel type of
AFM system. An XYZ set of attocube’s ultra stable ANPx311/HL/LT/UHV posi-
tioners helped in positioning the nanowire in the focus point of an interferom-
eter detecting its motion. A second 3D set of attocube positioners was used to
position and image the sample. Detection of both eigenmodes is possible due to
their distinct resonance frequency. Interaction with an in-plane field lead to a
rotation of the eigenmodes the angle of which yields the force field.
N. Rossi, F. R. Braakman, D. Cadeddu, D. Vasyukov, G. Tütüncüoglu, A. Fontcuberta i Morral & M. Poggio;
Nature Nanotechnology 12, 150–155 (2017).
Scanning Microwave Impedance Microscopy at 4 K and 9 T
T = 10 K
10 3
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10 1
10 -1
0
2
4 6
μ 0 H (T)
8
[110]
A set of linear positioners and scanners was implemented into a microwave
impedance microscope located inside a liquid Helium flow cryostat equipped
with a 9 T superconducting magnet [1]. The 1 GHz microwave signal was
guided to the cantilever probe, which detected the dielectric constant and
conductivity contrast of the sample during scanning. The system is a versa-
tile tool for fundamental research on complex materials and phase transi-
tions under various conditions.
[1] K. Lai, M. Nakamura, W. Kundhikanjana, M. Kawasaki, Y. Tokura, M. A. Kelly, and Z.-X. Shen, Science
329, 190 (2010).