Conducting-tip Atomic Force Microscopy (ct-AFM)
additional AFM mode upgrades
Conducting-tip Atomic Force Microscopy (ct-AFM)
Ct-AFM allows to map out the local electric response of a sample to
an applied bias voltage via the AFM tip. More information on the
details of this mode can be found on page 82.
Optical fiber
Dither piezo
Sample
Sample
U AC + U DC
The ct-AFM upgrade contains
• Low noise current amplifier
• 10 conductive tips
• Ct-AFM test sample
• Ct-AFM factory test at room temperture and low temperature
• Ct-AFM demonstration and training during the installation
Article Art.No.
Ct-AFM upgrade 1008504
ct-AFM on Ruthenium
attoMICROSCOPY
Sophisticated Tools for Science
PAGE 103