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Piezoresponse Force Microscopy (PFM)
additional AFM mode upgrades
Piezoresponse Force Microscopy (PFM)
PFM is capable of imaging the local deformation of a multiferroic
material in response to a local electric field caused by a voltage
supplied to the AFM tip. More information on the details of this
mode can be found on page 81.
Optical fiber
U AC
Dither piezo
Sample
The PFM upgrade contains
• 10 conductive AFM tips
• PFM test sample
• PFM factory test at room temperture and low temperature
• PFM demonstration and training during the installation
Article Art.No.
PFM upgrade 1009869
attocube logo written
into BFO by PFM
attoMICROSCOPY
Sophisticated Tools for Science