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Magnetic Force Microscopy (MFM)
additional AFM mode upgrades
Magnetic Force Microscopy (MFM)
MFM is one of the most widely used AFM techniques, and makes use
of a magnetic tip to map out the z-component of the gradient of the
magnetic stray field. More information on the details of this mode
can be found on page 79.
Optical fiber
MFM cantilever
Dither
Sample
The MFM upgrade contains
• 10 MFM tips
• MFM test sample
• MFM factory test at room temperture and low temperature
• MFM demonstration and training during the installation
MFM image of hard disc
Article Art.No.
MFM upgrade 1012468