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attoAFM I
low temperature atomic force microscope, cantilever based
The attoAFM I is a compact atomic force microscope designed particularly
for applications at low and ultra low temperatures. The instrument works by
scanning the sample below a fixed cantilever and by measuring its deflec-
tion with highest precision using a fiber based optical interferometer. Both
contact and non-contact mode are applicable. Furthermore, this system is
suited for magnetic force microscopy (MFM), electric force microscopy (EFM),
and other imaging modes.
The extreme stability of the measurement head allows also for combinations
with cryogen free pulse-tube based cooling systems for applications where
liquid helium is not available or desired. The attoAFM I is available with an
optional interferometric encoder for closed loop operation.
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The microscope uses a set of xyz-positioners for coarse positioning of the
sample over a range of several mm. Developed particularly for cryogenic
applications, the piezo-based scanner provides a large scan range of 50 µm x
50 µm at room temperature, and 30 µm x 30 µm at liquid helium temperature.
The exceptional combination of materials allows absolutely stable high
resolution imaging of surfaces. Possible applications are the measurement
of local sample properties such as topography, magnetic forces, or elasticity
of surface structures.
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01 vacuum window
02 LT and HV compatible feedthroughs
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03 microscope insert including single mode fiber
04 superconducting magnet (optional)
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05 attoDRY1100 cryostat (optional)
06 attoFPSensor based closed loop sensors (optional)
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07 attoAFM I+ head incl. alignment-free cantilever holder
08 quick exchange sample holder with 8 electrical contacts
09 ultra-large range xyz scanner 125 μm x 125 μm x 15 μm @ 4 K (optional)
Schematic drawing of the low temperature attoAFM I
and the attoDRY1100 cryostat (optional)
10 xyz coarse positioners 5 mm x 5 mm x 5 mm
11 ultra stable titanium housing