attoPUBLICATIONS attoCATALOG-2017/18 | Page 14
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Applications Overview
where ideas become results
CFM I | I I | I I I
Resonant Spectroscopy on a Single Quantum Dot . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Observation of Many-Body Exciton States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Scalable Architecture for Multi-Photon Boson Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . .
Confocal Microscopy on Quantum Dots at 50 mK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Photocurrent Measurements on Graphene Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Simultaneous Optical Reflection and Transmission Imaging . . . . . . . . . . . . . . . . . . . . . . . .
Collective Electronic Excitations of Trapped Dipolar Excitons . . . . . . . . . . . . . . . . . . . . . .
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143
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attoRAMAN
Raman Spectroscopy on Graphene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151
Magneto-Raman Microscopy for Probing Local Material Properties of Graphene . . . . . . . . 151
Cryogenic Photonic Probe Station
Ultra-Low Drift . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 155
atto3DR
Angle Dependent Magnetoresistance Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 159
Microscopy Solutions
attoAFM III Mounted on Mixing Chamber . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
attoAFM/CFM in Toploading Insert . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
attoAFM I Mounted on Mixing Chamber . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
attoAFM III in Toploading Insert . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Differential Conductance Measurements on Pd Break-Junctions . . . . . . . . . . . . . . . . . . . .
UK Scientists Discover Strongest Biological Material . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
In-Situ Characterization of Exposed E-Beam . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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