attoAFM / CFM
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attoAFM / CFM combined low temperature atomic force and confocal microscope , tuning fork based
The tuning fork based attoAFM / CFM not only allows fast optical investigation of the sample prior to detailed AFM studies , it also enables precise positioning of the AFM tip over small structures and optical control of the scanning process or any surface manipulation . Also , optical experiments such as Raman spectroscopy and tip enhanced Raman spectroscopy ( TERS ) can be conducted . Needless to say that all of these tasks can be performed in extreme environments , such as ultra low temperature , high vacuum and magnetic fields .
The attoAFM / CFM uses an Akiyama probe tip to investigate tip-sample interaction forces on the nanometer scale . The Akiyama probe is typically operated in non-contact mode using a phase-locked loop to excite the probe at resonance and track any shift in frequency due to tip-sample interactions . An additional PI controller keeps the frequency shift at a constant value while scanning over the surface . Simultaneously to the information provided by the Akiyama probe , the CFM reveals complementary optical information of the sample surface . Since the z-scanning motion is provided by a dedicated scanner on the side of the AFM , the focal distance between the low-temperature compatible lens and the sample does not change .
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Principle of atomic-sized magnetic sensors using NV centers . |
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Available Upgrade Option
• closed loop scanning & global sample coordinates ... for further details , see accessories section
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01 LT and HV compatible feedthroughs 02 vacuum window 03 microscope insert 04 superconducting magnet ( optional ) 05 liquid He dewar ( optional ) 06 confocal microscope objective 07 AFM Akiyama probe 08 two xyz coarse positioners and xyz scanner units 09 ultra stable Titanium housing |
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Schematic drawing of the low temperature attoAFM / CFM and the surrounding liquid Helium dewar ( optional ) |
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