attoAFM I low temperature atomic force microscope , cantilever based
The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperatures . The instrument works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical interferometer . Both contact and non-contact mode are applicable . Furthermore , this system is suited for magnetic force microscopy ( MFM ), electric force microscopy ( EFM ), and other imaging modes .
The extreme stability of the measurement head allows also for combinations with cryogen free pulse-tube based cooling systems for applications where liquid helium is not available or desired . The attoAFM I is available with an optional interferometric encoder for closed loop operation .
The microscope uses a set of xyz-positioners for coarse positioning of the sample over a range of several mm . Developed particularly for cryogenic applications , the piezo-based scanner provides a large scan range of 50 µ m x 50 µ m at room temperature , and 30 µ m x 30 µ m at liquid helium temperature . The exceptional combination of materials allows absolutely stable high resolution imaging of surfaces . Possible applications are the measurement of local sample properties such as topography , magnetic forces , or elasticity of surface structures .
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Schematic drawing of the low temperature attoAFM I and the attoDRY1100 cryostat ( optional )
01 vacuum window 02 LT and HV compatible feedthroughs 03 microscope insert including single mode fiber 04 superconducting magnet ( optional ) 05 attoDRY1100 cryostat ( optional ) 06 attoFPSensor based closed loop sensors ( optional ) 07 attoAFM I + head incl . alignment-free cantilever holder 08 quick exchange sample holder with 8 electrical contacts 09 ultra-large range xyz scanner 125 μm x 125 μm x 15 μm @ 4 K ( optional ) 10 xyz coarse positioners 5 mm x 5 mm x 5 mm 11 ultra stable titanium housing