attoAFM/CFM
combined low temperature atomic force and confocal microscope, tuning fork based
The tuning fork based attoAFM/CFM not only allows fast optical inves-
tigation of the sample prior to detailed AFM studies, it also enables
precise positioning of the AFM tip over small structures and optical
control of the scanning process or any surface manipulation. Also, op-
tical experiments such as Raman spectroscopy and tip enhanced Raman
spectroscopy (TERS) can be conducted. Needless to say that all of these
tasks can be performed in extreme environments, such as ultra low tem-
perature, high vacuum and magnetic fields.
The attoAFM/CFM uses an Akiyama probe tip to investigate tip-sample in-
teraction forces on the nanometer scale. The Akiyama probe is typical-
ly operated in non-contact mode using a phase-locked loop to excite
the probe at r